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Information card for entry 4117042
Preview
Coordinates | 4117042.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C80 H92 B2 N6 |
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Calculated formula | C80 H92 B2 N6 |
SMILES | C12CCC(CC1)N(N2c1cc(c(N2C3CCC(CC3)N2C(C)(C)C)cc1C)C)C(C)(C)C.[B-](c1ccccc1)(c1ccccc1)(c1ccccc1)c1ccccc1.C(#N)C.[B-](c1ccccc1)(c1ccccc1)(c1ccccc1)c1ccccc1.C(#N)C |
Title of publication | Charge-Localized p-Phenylenedihydrazine Radical Cations: ESR and Optical Studies of Intramolecular Electron Transfer Rates |
Authors of publication | Stephen F. Nelsen; Rustem F. Ismagilov; Douglas R. Powell |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 1997 |
Journal volume | 119 |
Pages of publication | 10213 - 10222 |
a | 9.5607 ± 0.0002 Å |
b | 13.7553 ± 0.0002 Å |
c | 25.5637 ± 0.0002 Å |
α | 90° |
β | 96.846 ± 0.002° |
γ | 90° |
Cell volume | 3337.92 ± 0.09 Å3 |
Cell temperature | 133 ± 2 K |
Ambient diffraction temperature | 133 ± 2 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0787 |
Residual factor for significantly intense reflections | 0.0502 |
Weighted residual factors for all reflections | 0.1284 |
Weighted residual factors for significantly intense reflections | 0.1141 |
Goodness-of-fit parameter for all reflections | 1.025 |
Goodness-of-fit parameter for significantly intense reflections | 1.082 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4117042.html
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