Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4117186
Preview
Coordinates | 4117186.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | Bis(ethylenedithio)tetrathiafulvalenium 1-pentafluorothio-2,2-difluoroethane-2-sulfonate (2:1) |
---|---|
Formula | C22 H18 F7 O3 S18 |
Calculated formula | C22 H18 F7 O3 S18 |
Title of publication | Superconductivity at 5.2 K in an Electron Donor Radical Salt of Bis(ethylenedithio)tetrathiafulvalene (BEDT-TTF) with the Novel Polyfluorinated Organic Anion SF~5~CH~2~CF~2~SO~3~^-^ |
Authors of publication | Urs Geiser; John A. Schlueter; H. Hau Wang; Aravinda M. Kini; Jack M. Williams; Paul P. Sche; Halina I. Zakowicz; Michael L. VanZile; James D. Dudek; Paul G. Nixon; Rolf W. Winter; Gary L. Gard; J. Ren; M.-H. Whangbo |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 1996 |
Journal volume | 118 |
Pages of publication | 9996 - 9997 |
a | 9.1536 ± 0.0006 Å |
b | 11.4395 ± 0.0008 Å |
c | 17.4905 ± 0.0012 Å |
α | 94.316 ± 0.001° |
β | 91.129 ± 0.001° |
γ | 102.764 ± 0.001° |
Cell volume | 1779.9 ± 0.2 Å3 |
Cell temperature | 123 K |
Ambient diffraction temperature | 123 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for significantly intense reflections | 0.046 |
Weighted residual factors for significantly intense reflections | 0.045 |
Goodness-of-fit parameter for significantly intense reflections | 1.635 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4117186.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.