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Information card for entry 4117310
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Coordinates | 4117310.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C72 H127 B3 F12 N12 Ni20 O64 |
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Calculated formula | C72 H120 B3 F12 N12 Ni20 O63 |
SMILES | [B](F)(F)(F)[F-].C12C=CC3[O]4[Ni]5678[OH]9[Ni]%10%11%12%13[O]%14C%15C=CC%16[O]%17[Ni]%18%19%20%21[OH]%22[Ni]%23%24%25%26[O]1[Ni]14([NH](C)C)([OH]5%23)[O]=C4C=CC5[O]%23[Ni]%27%28%29%30[OH]%31[Ni]%32%33%34%35[O]%36C%37C=CC%38[O]%39[Ni]%40%41%42%43[OH]%44[Ni]%45%46%47%48[OH]%27[Ni]%27%49([NH](C)C)([O]%45C%45C=CC([O]%29%49)=[O][Ni]%29%31([NH](C)C)([O]=%37)[O]%35C%31C=CC([O]%30%29)=[O][Ni]%23([NH](C)C)([OH]%24%28)([O]4%25)[O]=C4C=CC([O]%21[Ni]%22([NH](C)C)([O]=2)([O]4%26)[O]=%16)=[O][Ni]2([NH](C)C)([OH]%19%33)([O]%34C4C=CC([O]%202)=[O][Ni]%14%17([NH](C)C)([OH]%10%18)[O]=C2C=CC([O]%42[Ni]%10([NH](C)C)([OH]%11%41)([O]2%12)[O]=C2C=CC([O]8[Ni]9([NH](C)C)([O]=%15)([O]2%13)[O]=3)=[O][Ni]2([O]%46C(C=CC([O]72)=[O]1)=[O]%27)([NH](C)C)([OH]6%47)[O]=C1C=CC([O]%43[Ni]%44([NH](C)C)([O]=%45)([O]1%48)[O]=%38)=[O]%10)=[O][Ni]%36%39([NH](C)C)([OH]%32%40)[O]=4)[O]=%31)[O]=5.O.[B](F)(F)(F)[F-].O.[B](F)(F)(F)[F-].O |
Title of publication | Nanospheric [M20(OH)12(maleate)12(Me2NH)12]4+ Clusters (M = Co, Ni) with Oh Symmetry |
Authors of publication | Liu-Cheng Gui; Xiu-Jian Wang; Qing-Ling Ni; Miao Wang; Fu-Pei Liang; Hua-Hong Zou |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2012 |
Journal volume | 134 |
Pages of publication | 852 - 854 |
a | 18.9569 ± 0.0002 Å |
b | 18.9569 ± 0.0002 Å |
c | 18.9569 ± 0.0002 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 6812.43 ± 0.12 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 7 |
Space group number | 223 |
Hermann-Mauguin space group symbol | P m -3 n |
Hall space group symbol | -P 4n 2 3 |
Residual factor for all reflections | 0.1137 |
Residual factor for significantly intense reflections | 0.0985 |
Weighted residual factors for significantly intense reflections | 0.3163 |
Weighted residual factors for all reflections included in the refinement | 0.3326 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.017 |
Diffraction radiation wavelength | 1.54178 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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