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Information card for entry 4117713
Preview
| Coordinates | 4117713.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | Sm@C2(13)-C84.NiOEP.2toluene |
|---|---|
| Formula | C134 H60 N4 Ni Sm |
| Calculated formula | C134.074 H60 N4 Ni Sm1.02 |
| Title of publication | Isolation of Three Isomers of Sm@C84 and X-ray Crystallographic Characterization of Sm@D3d(19)-C84 and Sm@C2(13)-C84 |
| Authors of publication | Hua Yang; Meilan Yu; Hongxiao Jin; Ziyang Liu; Mingguang Yao; Bingbing Liu; Marilyn M. Olmstead; Alan L. Balch |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2012 |
| Journal volume | 134 |
| Pages of publication | 5331 - 5338 |
| a | 25.3572 ± 0.001 Å |
| b | 14.9526 ± 0.0006 Å |
| c | 20.5748 ± 0.0008 Å |
| α | 90° |
| β | 97.439 ± 0.003° |
| γ | 90° |
| Cell volume | 7735.4 ± 0.5 Å3 |
| Cell temperature | 90 ± 2 K |
| Ambient diffraction temperature | 90 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 12 |
| Hermann-Mauguin space group symbol | C 1 2/m 1 |
| Hall space group symbol | -C 2y |
| Residual factor for all reflections | 0.0808 |
| Residual factor for significantly intense reflections | 0.0662 |
| Weighted residual factors for significantly intense reflections | 0.1663 |
| Weighted residual factors for all reflections included in the refinement | 0.1787 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.022 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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