Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4117744
Preview
Coordinates | 4117744.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | 1,1,1,3,3,3-hexa-tert-butyltrisilane-2,2-diyl 1',3',4',5'-tetramethyl-2',3'-dihydro-1'H-imidazole-2',2'-diyl complex |
---|---|
Formula | C35 H74 N2 O Si3 |
Calculated formula | C35 H74 N2 O Si3 |
SMILES | [Si]([Si](C(C)(C)C)(C(C)(C)C)C(C)(C)C)([Si](C(C)(C)C)(C(C)(C)C)C(C)(C)C)=C1N(C(=C(N1C)C)C)C.O1CCCC1 |
Title of publication | An Isolable NHC-Stabilized Silylene Radical Cation: Synthesis and Structural Characterization |
Authors of publication | Hiroaki Tanaka; Masaaki Ichinohe; Akira Sekiguchi |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2012 |
Journal volume | 134 |
Pages of publication | 5540 - 5543 |
a | 15.7355 ± 0.0007 Å |
b | 16.2056 ± 0.0008 Å |
c | 30.5406 ± 0.0014 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 7788 ± 0.6 Å3 |
Cell temperature | 120 ± 1 K |
Ambient diffraction temperature | 120 ± 1 K |
Number of distinct elements | 5 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.082 |
Residual factor for significantly intense reflections | 0.0661 |
Weighted residual factors for significantly intense reflections | 0.2032 |
Weighted residual factors for all reflections included in the refinement | 0.2133 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.027 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4117744.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.