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Information card for entry 4118629
Preview
Coordinates | 4118629.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C37 H72 N3 P S Si6 U |
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Calculated formula | C37 H72 N3 P S Si6 U |
SMILES | [U](N([Si](C)(C)C)[Si](C)(C)C)(N([Si](C)(C)C)[Si](C)(C)C)(N([Si](C)(C)C)[Si](C)(C)C)=S.[P+](c1ccccc1)(c1ccccc1)(C)c1ccccc1 |
Title of publication | A Complete Family of Terminal Uranium Chalcogenides, [U(E)(N{SiMe3}2)3]- (E = O, S, Se, Te) |
Authors of publication | Jessie L. Brown; Skye Fortier; Richard A. Lewis; Guang Wu; Trevor W. Hayton |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2012 |
Journal volume | 134 |
Pages of publication | 15468 - 15475 |
a | 16.9301 ± 0.0004 Å |
b | 12.074 ± 0.0004 Å |
c | 24.2248 ± 0.0007 Å |
α | 90° |
β | 99.155 ± 0.002° |
γ | 90° |
Cell volume | 4888.8 ± 0.2 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0629 |
Residual factor for significantly intense reflections | 0.0342 |
Weighted residual factors for significantly intense reflections | 0.0634 |
Weighted residual factors for all reflections included in the refinement | 0.0712 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.994 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4118629.html
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