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Information card for entry 4119309
Preview
Coordinates | 4119309.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | thiophene-fused bisdehydro[12]annulene |
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Chemical name | tetrakis[5-(t-butyldimethylsilyl)thieno]bisdehydro[12]annulene |
Formula | C44 H64 S4 Si4 |
Calculated formula | C44 H64 S4 Si4 |
SMILES | c12C#Cc3c(c4c(C#Cc5c(c1cc(s2)[Si](C(C)(C)C)(C)C)cc(s5)[Si](C(C)(C)C)(C)C)sc(c4)[Si](C(C)(C)C)(C)C)cc(s3)[Si](C(C)(C)C)(C)C |
Title of publication | Thiophene-Fused Bisdehydro[12]annulene That Undergoes Transannular Alkyne Cycloaddition by Either Light or Heat |
Authors of publication | Aiko Fukazawa; Hiroya Oshima; Yoshihito Shiota; Shouya Takahashi; Kazunari Yoshizawa; Shigehiro Yamaguchi |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2013 |
Journal volume | 135 |
Pages of publication | 1731 - 1734 |
a | 11.497 ± 0.005 Å |
b | 13.961 ± 0.006 Å |
c | 16.959 ± 0.007 Å |
α | 106.591 ± 0.005° |
β | 98.874 ± 0.004° |
γ | 109.146 ± 0.005° |
Cell volume | 2370.3 ± 1.8 Å3 |
Cell temperature | 123 ± 2 K |
Ambient diffraction temperature | 123 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0981 |
Residual factor for significantly intense reflections | 0.0718 |
Weighted residual factors for significantly intense reflections | 0.1329 |
Weighted residual factors for all reflections included in the refinement | 0.1476 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.104 |
Diffraction radiation wavelength | 0.7107 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4119309.html
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Users of the data should acknowledge the original authors of the
structural data.