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Information card for entry 4119544
Preview
Coordinates | 4119544.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C60 H82 B2 Fe2 N2 P4 |
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Calculated formula | C60 H82 B2 Fe2 N2 P4 |
SMILES | [Fe]123([P](C(C)C)(c4c(cccc4)[B]3([C]32=CC=CC=C3)c2c([P]1(C(C)C)C(C)C)cccc2)C(C)C)[N]#[N][Fe]1234[P](c5c(cccc5)[B]3([C]32=[CH]4C=CC=C3)c2c([P]1(C(C)C)C(C)C)cccc2)(C(C)C)C(C)C |
Title of publication | H-H and Si-H Bond Addition to Fe\τbNNR2 Intermediates Derived from N2 |
Authors of publication | Daniel L. M. Suess; Jonas C. Peters |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2013 |
Journal volume | 135 |
Pages of publication | 4938 - 4941 |
a | 13.608 ± 0.0005 Å |
b | 22.6752 ± 0.0007 Å |
c | 18.8057 ± 0.0007 Å |
α | 90° |
β | 103.366 ± 0.001° |
γ | 90° |
Cell volume | 5645.6 ± 0.3 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0668 |
Residual factor for significantly intense reflections | 0.0359 |
Weighted residual factors for significantly intense reflections | 0.0795 |
Weighted residual factors for all reflections included in the refinement | 0.0916 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.023 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4119544.html
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