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Information card for entry 4120188
Preview
| Coordinates | 4120188.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C30 H44 Cl2 F6 N8 O10 S3 |
|---|---|
| Calculated formula | C30 H44 Cl2 F6 N8 O10 S3 |
| Title of publication | Small-Molecule-Induced Clustering of Heparan Sulfate Promotes Cell Adhesion |
| Authors of publication | Naohiro Takemoto; Tetsuya Suehara; Heidie L. Frisco; Shin-ichi Sato; Takuhito Sezaki; Kosuke Kusamori; Yoshinori Kawazoe; Sun Min Park; Sayumi Yamazoe; Yoshiyuki Mizuhata; Rintaro Inoue; Gavin J. Miller; Steen U. Hansen; Gordon C. Jayson; John M. Gardiner; Toshiji Kanaya; Norihiro Tokitoh; Kazumitsu Ueda; Yoshinobu Takakura; Noriyuki Kioka; Makiya Nishikawa; Motonari Uesugi |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2013 |
| Journal volume | 135 |
| Pages of publication | 11032 - 11039 |
| a | 13.314 ± 0.0007 Å |
| b | 13.6374 ± 0.0006 Å |
| c | 22.7765 ± 0.0012 Å |
| α | 99.1974 ± 0.0018° |
| β | 91.652 ± 0.002° |
| γ | 95.523 ± 0.005° |
| Cell volume | 4059.3 ± 0.4 Å3 |
| Cell temperature | 103 ± 2 K |
| Ambient diffraction temperature | 103 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1712 |
| Residual factor for significantly intense reflections | 0.0914 |
| Weighted residual factors for significantly intense reflections | 0.2132 |
| Weighted residual factors for all reflections included in the refinement | 0.2692 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.024 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4120188.html
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Users of the data should acknowledge the original authors of the
structural data.