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Information card for entry 4121635
Preview
Coordinates | 4121635.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C66 H152 N10 Rb2 Si6 U2 |
---|---|
Calculated formula | C66 H152 N10 Rb2 Si6 U2 |
SMILES | [U]123(N([Si](C(C)C)(C(C)C)C(C)C)CC[N]3(CCN1[Si](C(C)C)(C(C)C)C(C)C)CCN2[Si](C(C)C)(C(C)C)C(C)C)[NH]1[Rb][NH]([U]234N([Si](C(C)C)(C(C)C)C(C)C)CC[N]4(CCN2[Si](C(C)C)(C(C)C)C(C)C)CCN3[Si](C(C)C)(C(C)C)C(C)C)[Rb]1 |
Title of publication | Synthesis and Characterization of an f-Block Terminal Parent Imido [U═NH] Complex: A Masked Uranium(IV) Nitride. |
Authors of publication | King, David M.; McMaster, Jonathan; Tuna, Floriana; McInnes, Eric J. L.; Lewis, William; Blake, Alexander J.; Liddle, Stephen T. |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2014 |
Journal volume | 136 |
Journal issue | 15 |
Pages of publication | 5619 |
a | 13.7768 ± 0.0002 Å |
b | 23.1164 ± 0.0004 Å |
c | 26.8905 ± 0.0005 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 8563.8 ± 0.3 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 6 |
Space group number | 61 |
Hermann-Mauguin space group symbol | P b c a |
Hall space group symbol | -P 2ac 2ab |
Residual factor for all reflections | 0.0752 |
Residual factor for significantly intense reflections | 0.0439 |
Weighted residual factors for significantly intense reflections | 0.0948 |
Weighted residual factors for all reflections included in the refinement | 0.1103 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.013 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4121635.html
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