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Information card for entry 4121674
Preview
Coordinates | 4121674.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C70 H72 B P3 Ru Si |
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Calculated formula | C70 H72 B P3 Ru Si |
SMILES | c1c(cccc1)C.[Ru]1234([H][Si]([H]1)(c1c(C4)cc(C)cc1C)c1c(C)cc(cc1C)C)[P](c1ccccc1)(C[B](C[P]2(c1ccccc1)c1ccccc1)(c1ccccc1)C[P]3(c1ccccc1)c1ccccc1)c1ccccc1 |
Title of publication | Interconversion of η(3)-H2SiRR' σ-Complexes and 16-Electron Silylene Complexes via Reversible H-H or C-H Elimination. |
Authors of publication | Lipke, Mark C.; Neumeyer, Felix; Tilley, T. Don |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2014 |
Journal volume | 136 |
Journal issue | 16 |
Pages of publication | 6092 - 6102 |
a | 12.1371 ± 0.0006 Å |
b | 14.68 ± 0.0006 Å |
c | 18.6112 ± 0.0009 Å |
α | 70.662 ± 0.002° |
β | 76.209 ± 0.002° |
γ | 68.311 ± 0.002° |
Cell volume | 2881.8 ± 0.2 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0399 |
Residual factor for significantly intense reflections | 0.0323 |
Weighted residual factors for significantly intense reflections | 0.0755 |
Weighted residual factors for all reflections included in the refinement | 0.0798 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.049 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4121674.html
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