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Information card for entry 4122536
Preview
| Coordinates | 4122536.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C29 H34 N2 Ru |
|---|---|
| Calculated formula | C29 H34 N2 Ru |
| SMILES | C12N([C]34=[C]5(C[Ru]=2678945[c]2([c]6(C)[c]7([c]8(C)[c]92C)C)C)C=CC=C3C)C=CN1c1c(C)cccc1C |
| Title of publication | Cyclometalated N-Heterocyclic Carbene Complexes of Ruthenium for Access to Electron-Rich Silylene Complexes That Bind the Lewis Acids CuOTf and AgOTf. |
| Authors of publication | Liu, Hsueh-Ju; Raynaud, Christophe; Eisenstein, Odile; Tilley, T. Don |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2014 |
| Journal volume | 136 |
| Journal issue | 32 |
| Pages of publication | 11473 - 11482 |
| a | 9.3027 ± 0.0004 Å |
| b | 19.5605 ± 0.0008 Å |
| c | 13.5408 ± 0.0006 Å |
| α | 90° |
| β | 94.688 ± 0.002° |
| γ | 90° |
| Cell volume | 2455.71 ± 0.18 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0695 |
| Residual factor for significantly intense reflections | 0.0455 |
| Weighted residual factors for significantly intense reflections | 0.0991 |
| Weighted residual factors for all reflections included in the refinement | 0.1096 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.037 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4122536.html
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