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Information card for entry 4122538
Preview
| Coordinates | 4122538.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C43 H49 N2 Ru Si |
|---|---|
| Calculated formula | C43 H49 N2 Ru Si |
| SMILES | C12N(c3c(C[Ru]=24567([c]2([c]7([c]6([c]5([c]42C)C)C)C)C)[SiH2]c2ccc(C)cc2)cccc3C)C=CN1c1c(C)cccc1C.c1(ccccc1)C |
| Title of publication | Cyclometalated N-Heterocyclic Carbene Complexes of Ruthenium for Access to Electron-Rich Silylene Complexes That Bind the Lewis Acids CuOTf and AgOTf. |
| Authors of publication | Liu, Hsueh-Ju; Raynaud, Christophe; Eisenstein, Odile; Tilley, T. Don |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2014 |
| Journal volume | 136 |
| Journal issue | 32 |
| Pages of publication | 11473 - 11482 |
| a | 21.079 ± 0.008 Å |
| b | 8.837 ± 0.003 Å |
| c | 20.204 ± 0.008 Å |
| α | 90° |
| β | 94.557 ± 0.006° |
| γ | 90° |
| Cell volume | 3752 ± 2 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.2334 |
| Residual factor for significantly intense reflections | 0.092 |
| Weighted residual factors for significantly intense reflections | 0.146 |
| Weighted residual factors for all reflections included in the refinement | 0.1942 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.923 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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