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Information card for entry 4122540
Preview
| Coordinates | 4122540.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | hj4032 |
|---|---|
| Formula | C44 H60 N2 Ru Si |
| Calculated formula | C44 H60 N2 Ru Si |
| SMILES | C[c]12[c]3([c]4(C)[c]5(C)[c]1(C)[RuH]12345(=C2N(c3c(C1)cccc3C)C=CN2c1c(C)cccc1C)[SiH2]c1c(C(C)C)cc(C(C)C)cc1C(C)C)C |
| Title of publication | Cyclometalated N-Heterocyclic Carbene Complexes of Ruthenium for Access to Electron-Rich Silylene Complexes That Bind the Lewis Acids CuOTf and AgOTf. |
| Authors of publication | Liu, Hsueh-Ju; Raynaud, Christophe; Eisenstein, Odile; Tilley, T. Don |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2014 |
| Journal volume | 136 |
| Journal issue | 32 |
| Pages of publication | 11473 - 11482 |
| a | 10.2942 ± 0.0006 Å |
| b | 31.8285 ± 0.0017 Å |
| c | 12.239 ± 0.0007 Å |
| α | 90° |
| β | 105.762 ± 0.002° |
| γ | 90° |
| Cell volume | 3859.3 ± 0.4 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0375 |
| Residual factor for significantly intense reflections | 0.0344 |
| Weighted residual factors for significantly intense reflections | 0.0848 |
| Weighted residual factors for all reflections included in the refinement | 0.0865 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.079 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4122540.html
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Users of the data should acknowledge the original authors of the
structural data.