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Information card for entry 4122540
Preview
Coordinates | 4122540.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | hj4032 |
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Formula | C44 H60 N2 Ru Si |
Calculated formula | C44 H60 N2 Ru Si |
SMILES | C[c]12[c]3([c]4(C)[c]5(C)[c]1(C)[RuH]12345(=C2N(c3c(C1)cccc3C)C=CN2c1c(C)cccc1C)[SiH2]c1c(C(C)C)cc(C(C)C)cc1C(C)C)C |
Title of publication | Cyclometalated N-Heterocyclic Carbene Complexes of Ruthenium for Access to Electron-Rich Silylene Complexes That Bind the Lewis Acids CuOTf and AgOTf. |
Authors of publication | Liu, Hsueh-Ju; Raynaud, Christophe; Eisenstein, Odile; Tilley, T. Don |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2014 |
Journal volume | 136 |
Journal issue | 32 |
Pages of publication | 11473 - 11482 |
a | 10.2942 ± 0.0006 Å |
b | 31.8285 ± 0.0017 Å |
c | 12.239 ± 0.0007 Å |
α | 90° |
β | 105.762 ± 0.002° |
γ | 90° |
Cell volume | 3859.3 ± 0.4 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0375 |
Residual factor for significantly intense reflections | 0.0344 |
Weighted residual factors for significantly intense reflections | 0.0848 |
Weighted residual factors for all reflections included in the refinement | 0.0865 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.079 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4122540.html
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