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Information card for entry 4122812
Preview
Coordinates | 4122812.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C160 H240 Au24 S16 |
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Calculated formula | C160 H240 Au24 S16 |
SMILES | [Au]123[Au]4567[Au]89%10%11%12%13[Au]%14%15([Au]%16%17%188([Au]8%19149%14[Au]149%14([Au]([S]3C3%20CC%21CC(CC(C3)C%21)C%20)[S]%14C3%14CC%20CC(CC(C3)C%20)C%14)[Au]3%14([Au]%20%21%22%23%16[Au]%16%24%25%26%10%17813[Au]1385%114[Au]6([S]7C45CC6CC(CC(C4)C6)C5)[S]([Au]453[Au]3%121([Au]16%18%20%16[Au]7%10%11%12([Au]%21([S]%23C%16%17CC%18CC(CC(C%16)C%18)C%17)[S]%12C%12%16CC%17CC(CC(C%12)C%17)C%16)[Au]%12([Au]%16%17%18%2417([Au]1%22%25%10([Au]9%2684%16[S]([Au]4%171[Au]%11%18([S]4C14CC7CC(CC(C1)C7)C4)[S]%12C14CC7CC(CC(C1)C7)C4)C14CC7CC(CC(C1)C7)C4)[S]%14C14CC7CC(CC(C1)C7)C4)[S]53C13CC4CC(CC(C1)C4)C3)[S]6C13CC4CC(CC(C1)C4)C3)[S]%13C13CC4CC(CC(C1)C4)C3)C13CC4CC(CC(C1)C4)C3)[S]%19C13CC4CC(CC(C1)C4)C3)[S]%15C13CC4CC(CC(C1)C4)C3)[S]2C12CC3CC(CC(C1)C3)C2 |
Title of publication | Au24(SAdm)16 Nanomolecules: X-ray Crystal Structure, Theoretical Analysis, Adaptability of Adamantane Ligands to Form Au23(SAdm)16 and Au25(SAdm)16, and Its Relation to Au25(SR)18. |
Authors of publication | Crasto, David; Barcaro, Giovanni; Stener, Mauro; Sementa, Luca; Fortunelli, Alessandro; Dass, Amala |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2014 |
Journal volume | 136 |
Journal issue | 42 |
Pages of publication | 14933 - 14940 |
a | 16.362 ± 0.003 Å |
b | 19.9 ± 0.003 Å |
c | 32.189 ± 0.005 Å |
α | 89.736 ± 0.009° |
β | 77.79 ± 0.008° |
γ | 80.239 ± 0.009° |
Cell volume | 10090 ± 3 Å3 |
Cell temperature | 100 K |
Ambient diffraction temperature | 100.28 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0902 |
Residual factor for significantly intense reflections | 0.0519 |
Weighted residual factors for significantly intense reflections | 0.1646 |
Weighted residual factors for all reflections included in the refinement | 0.1797 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.047 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Diffraction radiation X-ray symbol | K-L~3~ |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4122812.html
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