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Information card for entry 4122892
Preview
| Coordinates | 4122892.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C44.5 H44 Cl N5 O2 S5 |
|---|---|
| Calculated formula | C44.5 H44 Cl N5 O2 S5 |
| Title of publication | Two-Dimensional π-Expanded Quinoidal Terthiophenes Terminated with Dicyanomethylenes as n-Type Semiconductors for High-Performance Organic Thin-Film Transistors. |
| Authors of publication | Zhang, Cheng; Zang, Yaping; Gann, Eliot; McNeill, Christopher R.; Zhu, Xiaozhang; Di, Chong-An; Zhu, Daoben |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2014 |
| Pages of publication | 141106072905001 |
| a | 13.212 ± 0.003 Å |
| b | 37.811 ± 0.008 Å |
| c | 10.198 ± 0.002 Å |
| α | 90° |
| β | 109.57 ± 0.03° |
| γ | 90° |
| Cell volume | 4800 ± 2 Å3 |
| Cell temperature | 113 ± 2 K |
| Ambient diffraction temperature | 113 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.1704 |
| Residual factor for significantly intense reflections | 0.1514 |
| Weighted residual factors for significantly intense reflections | 0.4288 |
| Weighted residual factors for all reflections included in the refinement | 0.4522 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.808 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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