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Information card for entry 4123232
Preview
Coordinates | 4123232.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C28 H32 B F11 N8 P Rh |
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Calculated formula | C28 H32 B F11 N8 P Rh |
SMILES | [BH]12n3c(cc(C)[n]3[Rh](c3c(c(c(c(F)n3)F)F)F)(F)([n]3c(C)cc(C)n13)([n]1c(C)cc(C)n21)[P](C)(C)C)C.F.c1(c(c(c(c(F)n1)F)F)F)F |
Title of publication | Activation of B-H, Si-H, and C-F Bonds with Tp'Rh(PMe3) Complexes: Kinetics, Mechanism, and Selectivity. |
Authors of publication | Procacci, Barbara; Jiao, Yunzhe; Evans, Meagan E.; Jones, William D.; Perutz, Robin N.; Whitwood, Adrian C. |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2015 |
Journal volume | 137 |
Journal issue | 3 |
Pages of publication | 1258 - 1272 |
a | 34.3584 ± 0.0013 Å |
b | 8.5376 ± 0.0003 Å |
c | 22.8054 ± 0.0009 Å |
α | 90° |
β | 99.322 ± 0.004° |
γ | 90° |
Cell volume | 6601.3 ± 0.4 Å3 |
Cell temperature | 110 ± 2 K |
Ambient diffraction temperature | 110 ± 2 K |
Number of distinct elements | 7 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0458 |
Residual factor for significantly intense reflections | 0.0356 |
Weighted residual factors for significantly intense reflections | 0.0785 |
Weighted residual factors for all reflections included in the refinement | 0.083 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.039 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4123232.html
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