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Information card for entry 4123705
Preview
Coordinates | 4123705.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C54 H54 B2 Cl6 |
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Calculated formula | C54 H54 B2 Cl6 |
SMILES | B(c1cc2c3c(ccc4cc(B(c5c(cc(cc5C)C)C)c5c(cc(cc5C)C)C)cc(cc2)c34)c1)(c1c(cc(cc1C)C)C)c1c(cc(cc1C)C)C.C(Cl)(Cl)Cl.C(Cl)(Cl)Cl |
Title of publication | Electron Delocalization in Reduced Forms of 2-(BMes2)pyrene and 2,7-Bis(BMes2)pyrene. |
Authors of publication | Ji, Lei; Edkins, Robert M.; Lorbach, Andreas; Krummenacher, Ivo; Brückner, Charlotte; Eichhorn, Antonius; Braunschweig, Holger; Engels, Bernd; Low, Paul J.; Marder, Todd B. |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2015 |
Journal volume | 137 |
Journal issue | 21 |
Pages of publication | 6750 - 6753 |
a | 8.3467 ± 0.0019 Å |
b | 10.442 ± 0.002 Å |
c | 14.843 ± 0.003 Å |
α | 109.364 ± 0.006° |
β | 94.604 ± 0.007° |
γ | 92.908 ± 0.007° |
Cell volume | 1212.4 ± 0.4 Å3 |
Cell temperature | 100 K |
Ambient diffraction temperature | 100 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1537 |
Residual factor for significantly intense reflections | 0.0636 |
Weighted residual factors for significantly intense reflections | 0.1368 |
Weighted residual factors for all reflections included in the refinement | 0.1682 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.884 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4123705.html
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Users of the data should acknowledge the original authors of the
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