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Information card for entry 4123753
Preview
Coordinates | 4123753.cif |
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Original paper (by DOI) | HTML |
Formula | C34 H20 Ca O8 |
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Calculated formula | C34 H20 Ca O8 |
SMILES | c1c(c(cc(c1c1ccc(cc1)C(=O)[O-])c1ccc(cc1)C(=O)O)c1ccc(cc1)C(=O)[O-])c1ccc(cc1)C(=O)O.[Ca+2] |
Title of publication | Direct Observation of Xe and Kr Adsorption in a Xe-Selective Microporous Metal-Organic Framework. |
Authors of publication | Chen, Xianyin; Plonka, Anna M.; Banerjee, Debasis; Krishna, Rajamani; Schaef, Herbert T.; Ghose, Sanjit; Thallapally, Praveen K.; Parise, John B. |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2015 |
Journal volume | 137 |
Journal issue | 22 |
Pages of publication | 7007 - 7010 |
a | 5.1011 ± 0.0003 Å |
b | 10.8715 ± 0.0009 Å |
c | 15.2363 ± 0.0008 Å |
α | 83.132 ± 0.005° |
β | 85.982 ± 0.004° |
γ | 83.032 ± 0.005° |
Cell volume | 831.37 ± 0.1 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0854 |
Residual factor for significantly intense reflections | 0.0523 |
Weighted residual factors for significantly intense reflections | 0.1166 |
Weighted residual factors for all reflections included in the refinement | 0.1358 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.018 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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