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Information card for entry 4124896
Preview
Coordinates | 4124896.cif |
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Original paper (by DOI) | HTML |
Formula | C16 H3 F20 O2 Se |
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Calculated formula | C16 H3 F20 O2 Se |
SMILES | [Se]12c3c(cccc3C(O2)(C(C(F)(F)F)(F)F)C(C(F)(F)F)(F)F)C(O1)(C(C(F)(F)F)(F)F)C(C(F)(F)F)(F)F |
Title of publication | Isolation of Hypervalent Group-16 Radicals and Their Application in Organic-Radical Batteries. |
Authors of publication | Imada, Yasuyuki; Nakano, Hideyuki; Furukawa, Ko; Kishi, Ryohei; Nakano, Masayoshi; Maruyama, Hitoshi; Nakamoto, Masaaki; Sekiguchi, Akira; Ogawa, Masahiro; Ohta, Toshiaki; Yamamoto, Yohsuke |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2016 |
Journal volume | 138 |
Journal issue | 2 |
Pages of publication | 479 - 482 |
a | 11.7263 ± 0.001 Å |
b | 11.8526 ± 0.001 Å |
c | 15.8755 ± 0.0013 Å |
α | 90° |
β | 105.809 ± 0.001° |
γ | 90° |
Cell volume | 2123 ± 0.3 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 5 |
Space group number | 4 |
Hermann-Mauguin space group symbol | P 1 21 1 |
Hall space group symbol | P 2yb |
Residual factor for all reflections | 0.0667 |
Residual factor for significantly intense reflections | 0.0617 |
Weighted residual factors for significantly intense reflections | 0.1723 |
Weighted residual factors for all reflections included in the refinement | 0.1776 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.066 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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