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Information card for entry 4124964
Preview
Coordinates | 4124964.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C41 H51 Cl O8 Si4 |
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Calculated formula | C41 H51 Cl O8 Si4 |
SMILES | ClC.[Si]1(Oc2c(c3O[Si](Oc4c(c5O[Si](Oc6c(c7O[Si](Oc8c(c(O1)c1Cc2cc3Cc4cc5Cc6cc7Cc8c1)C)(C)C)C)(C)C)C)(C)C)C)(C)C |
Title of publication | Enclathration and Confinement of Small Gases by the Intrinsically 0D Porous Molecular Solid, Me,H,SiMe2. |
Authors of publication | Kane, Christopher M.; Banisafar, Arash; Dougherty, Timothy P.; Barbour, Leonard J.; Holman, K. Travis |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2016 |
Journal volume | 138 |
Journal issue | 13 |
Pages of publication | 4377 - 4392 |
a | 23.819 ± 0.002 Å |
b | 8.3375 ± 0.0009 Å |
c | 42.216 ± 0.004 Å |
α | 90° |
β | 99.032 ± 0.001° |
γ | 90° |
Cell volume | 8279.8 ± 1.4 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 5 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0704 |
Residual factor for significantly intense reflections | 0.0521 |
Weighted residual factors for significantly intense reflections | 0.1356 |
Weighted residual factors for all reflections included in the refinement | 0.1445 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.059 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4124964.html
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