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Information card for entry 4125010
Preview
| Coordinates | 4125010.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C55 H77 B2 K N5 Sn |
|---|---|
| Calculated formula | C55 H77 B2 K N5 Sn |
| Title of publication | Enabling and Probing Oxidative Addition and Reductive Elimination at a Group 14 Metal Center: Cleavage and Functionalization of E-H Bonds by a Bis(boryl)stannylene. |
| Authors of publication | Protchenko, Andrey V.; Bates, Joshua I.; Saleh, Liban M. A.; Blake, Matthew P.; Schwarz, Andrew D.; Kolychev, Eugene L.; Thompson, Amber L.; Jones, Cameron; Mountford, Philip; Aldridge, Simon |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2016 |
| Journal volume | 138 |
| Journal issue | 13 |
| Pages of publication | 4555 - 4564 |
| a | 17.8585 ± 0.0001 Å |
| b | 43.5512 ± 0.0002 Å |
| c | 19.1937 ± 0.0001 Å |
| α | 90° |
| β | 117.11 ± 0.0003° |
| γ | 90° |
| Cell volume | 13288 ± 0.12 Å3 |
| Cell temperature | 150 K |
| Ambient diffraction temperature | 150 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/a 1 |
| Hall space group symbol | -P 2yab |
| Residual factor for all reflections | 0.0941 |
| Residual factor for significantly intense reflections | 0.0576 |
| Weighted residual factors for all reflections | 0.1812 |
| Weighted residual factors for significantly intense reflections | 0.1433 |
| Weighted residual factors for all reflections included in the refinement | 0.1812 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.9674 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4125010.html
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Users of the data should acknowledge the original authors of the
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