Nalluri, Siva Krishna Mohan; Liu, Zhichang; Wu, Yilei; Hermann, Keith R.; Samanta, Avik; Kim, Dong Jun; Krzyaniak, Matthew D.; Wasielewski, Michael R.; Stoddart, J. Fraser
Journal of publication
Journal of the American Chemical Society
Year of publication
2016
Journal volume
138
Journal issue
18
Pages of publication
5968 - 5977
a
9.2311 ± 0.0004 Å
b
18.4418 ± 0.0007 Å
c
37.1578 ± 0.0014 Å
α
90°
β
90°
γ
90°
Cell volume
6325.7 ± 0.4 Å3
Cell temperature
100 ± 2 K
Ambient diffraction temperature
99.99 K
Number of distinct elements
5
Space group number
19
Hermann-Mauguin space group symbol
P 21 21 21
Hall space group symbol
P 2ac 2ab
Residual factor for all reflections
0.1038
Residual factor for significantly intense reflections
0.1034
Weighted residual factors for significantly intense reflections
0.2685
Weighted residual factors for all reflections included in the refinement
0.2688
Goodness-of-fit parameter for all reflections included in the refinement