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Information card for entry 4125050
Preview
Coordinates | 4125050.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C32 H82 Ce N7 Si6 |
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Calculated formula | C32 H82 Ce N7 Si6 |
SMILES | [Ce]12(N([Si](C)(C)C)[Si](C)(C)C)([N](=C(N1C(C)C)N([Si](C)(C)C)[Si](C)(C)C)C(C)C)[N](=C(N2C(C)C)N([Si](C)(C)C)[Si](C)(C)C)C(C)C |
Title of publication | Cerium Photosensitizers: Structure-Function Relationships and Applications in Photocatalytic Aryl Coupling Reactions. |
Authors of publication | Yin, Haolin; Carroll, Patrick J.; Manor, Brian C.; Anna, Jessica M.; Schelter, Eric J. |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2016 |
Journal volume | 138 |
Journal issue | 18 |
Pages of publication | 5984 - 5993 |
a | 13.6334 ± 0.0004 Å |
b | 14.3685 ± 0.0004 Å |
c | 16.3214 ± 0.0005 Å |
α | 111.454 ± 0.001° |
β | 93.753 ± 0.001° |
γ | 110.532 ± 0.001° |
Cell volume | 2716.95 ± 0.14 Å3 |
Cell temperature | 100 ± 1 K |
Ambient diffraction temperature | 100 ± 1 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0191 |
Residual factor for significantly intense reflections | 0.0174 |
Weighted residual factors for significantly intense reflections | 0.0428 |
Weighted residual factors for all reflections included in the refinement | 0.0434 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.069 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4125050.html
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