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Information card for entry 4125402
Preview
| Coordinates | 4125402.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C50 H56 Si2 |
|---|---|
| Calculated formula | C50 H56 Si2 |
| SMILES | c12c(c3ccc4c(c3c2cc2c(c3c(c2c1)c1c(cc3)cccc1)C#C[Si](C(C)C)(C(C)C)C(C)C)cccc4)C#C[Si](C(C)C)(C(C)C)C(C)C |
| Title of publication | Modulating Paratropicity Strength in Diareno-Fused Antiaromatics. |
| Authors of publication | Frederickson, Conerd K.; Zakharov, Lev N.; Haley, Michael M. |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2016 |
| Journal volume | 138 |
| Journal issue | 51 |
| Pages of publication | 16827 - 16838 |
| a | 8.0881 ± 0.0005 Å |
| b | 25.6677 ± 0.0015 Å |
| c | 10.3505 ± 0.0006 Å |
| α | 90° |
| β | 104.61 ± 0.004° |
| γ | 90° |
| Cell volume | 2079.3 ± 0.2 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 3 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.1168 |
| Residual factor for significantly intense reflections | 0.0627 |
| Weighted residual factors for significantly intense reflections | 0.1389 |
| Weighted residual factors for all reflections included in the refinement | 0.1628 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.053 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4125402.html
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Users of the data should acknowledge the original authors of the
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