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Information card for entry 4125899
Preview
| Coordinates | 4125899.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | 4EtPd |
|---|---|
| Formula | C40 H72 Li4 O4 Pd |
| Calculated formula | C40 H72 Li4 O4 Pd |
| SMILES | [Pd]123456([C]78(=[C]9%10([C]%11%12(=[C]2(CC)([Li]579%11[O]2CCCC2)[Li]68%10%12[O]2CCCC2)CC)CC)CC)[C]25(=[C]67([C]89(=[C]1(CC)([Li]3268[O]1CCCC1)[Li]4579[O]1CCCC1)CC)CC)CC |
| Title of publication | Spiro Metallaaromatics of Pd, Pt, Rh: Synthesis and Characterization. |
| Authors of publication | Zhang, Yongliang; Wei, Junnian; Chi, Yue; Zhang, Xuan; Zhang, Wen-Xiong; Xi, Zhenfeng |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2017 |
| a | 19.108 ± 0.0008 Å |
| b | 10.045 ± 0.0005 Å |
| c | 23.563 ± 0.0009 Å |
| α | 90° |
| β | 105.426 ± 0.004° |
| γ | 90° |
| Cell volume | 4359.7 ± 0.3 Å3 |
| Cell temperature | 180.01 ± 0.1 K |
| Ambient diffraction temperature | 180.01 ± 0.1 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0687 |
| Residual factor for significantly intense reflections | 0.0472 |
| Weighted residual factors for significantly intense reflections | 0.1123 |
| Weighted residual factors for all reflections included in the refinement | 0.1257 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.023 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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