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Information card for entry 4125902
Preview
Coordinates | 4125902.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C40 H80 Li5 O4 Rh Si4 |
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Calculated formula | C40 H80 Li5 O4 Rh Si4 |
SMILES | [Rh]12345[C]67([Si](C)(C)C)=[C]89([C]%10%11(=[C]1([Si](C)(C)C)([Li]68%10[O]1CCCC1)([Li]79%11[O]1CCCC1)[Li]2[C]124(=[C]46([C]78(=[C]3([Si](C)(C)C)([Li]147[O]1CCCC1)[Li]5268[O]1CCCC1)C)C)[Si](C)(C)C)C)C |
Title of publication | Spiro Metallaaromatics of Pd, Pt, Rh: Synthesis and Characterization. |
Authors of publication | Zhang, Yongliang; Wei, Junnian; Chi, Yue; Zhang, Xuan; Zhang, Wen-Xiong; Xi, Zhenfeng |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2017 |
a | 12.0164 ± 0.0008 Å |
b | 20.6077 ± 0.0014 Å |
c | 20.6174 ± 0.0015 Å |
α | 90° |
β | 92.763 ± 0.006° |
γ | 90° |
Cell volume | 5099.6 ± 0.6 Å3 |
Cell temperature | 180 ± 0.1 K |
Ambient diffraction temperature | 180 ± 0.1 K |
Number of distinct elements | 6 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.114 |
Residual factor for significantly intense reflections | 0.0862 |
Weighted residual factors for significantly intense reflections | 0.1856 |
Weighted residual factors for all reflections included in the refinement | 0.1992 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.132 |
Diffraction radiation wavelength | 0.7107 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4125902.html
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