Crystallography Open Database

Information card for entry 4126545

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Coordinates	4126545.cif
Original paper (by DOI)	HTML

Structure parameters

Formula	Cs3 F2 O10 Si4 Tb
Calculated formula	Cs3 F2 O10 Si4 Tb
Title of publication	Observation of Intense X-ray Scintillation in a Family of Mixed Anion Silicates, Cs3RESi4O10F2 (RE = Y, Eu-Lu), Obtained via an Enhanced Flux Crystal Growth Technique.
Authors of publication	Morrison, Gregory; Latshaw, Allison M.; Spagnuolo, Nicholas R.; Zur Loye, Hans-Conrad
Journal of publication	Journal of the American Chemical Society
Year of publication	2017
a	7.0832 ± 0.0002 Å
b	7.1346 ± 0.0002 Å
c	16.2121 ± 0.0005 Å
α	95.809 ± 0.001°
β	90.058 ± 0.001°
γ	119.765 ± 0.001°
Cell volume	706.3 ± 0.04 Å³
Cell temperature	300 ± 2 K
Ambient diffraction temperature	300 K
Number of distinct elements	5
Space group number	2
Hermann-Mauguin space group symbol	P -1
Hall space group symbol	-P 1
Residual factor for all reflections	0.0196
Residual factor for significantly intense reflections	0.0194
Weighted residual factors for significantly intense reflections	0.0465
Weighted residual factors for all reflections included in the refinement	0.0466
Goodness-of-fit parameter for all reflections included in the refinement	1.135
Diffraction radiation wavelength	0.71073 Å
Diffraction radiation type	MoKα
Has coordinates	Yes
Has disorder	No
Has F_obs	No

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