Information card for entry 4126547

Structure parameters

• Formula: Cs3 F2 O10 Si4 Tm
• Calculated formula: Cs3 F2 O10 Si4 Tm
• Title of publication: Observation of Intense X-ray Scintillation in a Family of Mixed Anion Silicates, Cs3RESi4O10F2 (RE = Y, Eu-Lu), Obtained via an Enhanced Flux Crystal Growth Technique.
• Authors of publication: Morrison, Gregory; Latshaw, Allison M.; Spagnuolo, Nicholas R.; Zur Loye, Hans-Conrad
• Journal of publication: Journal of the American Chemical Society
• Year of publication: 2017
• a: 7.078 ± 0.0006 Å
• b: 7.1138 ± 0.0006 Å
• c: 16.104 ± 0.0012 Å
• α: 95.807 ± 0.003°
• β: 90.018 ± 0.003°
• γ: 119.799 ± 0.003°
• Cell volume: 698.83 ± 0.1 ų
• Cell temperature: 302 ± 2 K
• Ambient diffraction temperature: 302.01 K
• Number of distinct elements: 5
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0511
• Residual factor for significantly intense reflections: 0.046
• Weighted residual factors for significantly intense reflections: 0.1125
• Weighted residual factors for all reflections included in the refinement: 0.1156
• Goodness-of-fit parameter for all reflections included in the refinement: 1.108
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No