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Information card for entry 4127015
Preview
| Coordinates | 4127015.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C4 H22 B20 S2 |
|---|---|
| Calculated formula | C4 H22 B20 S2 |
| SMILES | S(S[C]1234[CH]567[BH]891[BH]1%102[BH]2%113[BH]345[BH]456[BH]678[BH]791[BH]1%102[BH]467[BH]%11351)[C]1234[CH]567[BH]891[BH]1%105[BH]5%116[BH]627[BH]273[BH]348[BH]482[BH]567[BH]1%114[BH]9%1038 |
| Title of publication | Atomically Precise Site-Specific Tailoring and Directional Assembly of Superatomic Silver Nanoclusters. |
| Authors of publication | Wang, Zhao-Yang; Wang, Meng-Qi; Li, Yan-Ling; Luo, Peng; Jia, Tong-Tong; Huang, Ren-Wu; Zang, Shuang-Quan; Mak, Thomas C. W. |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2018 |
| a | 23.5545 ± 0.0007 Å |
| b | 6.98845 ± 0.00019 Å |
| c | 11.5542 ± 0.0003 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1901.93 ± 0.09 Å3 |
| Cell temperature | 150 ± 0.1 K |
| Ambient diffraction temperature | 150 ± 0.1 K |
| Number of distinct elements | 4 |
| Space group number | 33 |
| Hermann-Mauguin space group symbol | P n a 21 |
| Hall space group symbol | P 2c -2n |
| Residual factor for all reflections | 0.0484 |
| Residual factor for significantly intense reflections | 0.0471 |
| Weighted residual factors for significantly intense reflections | 0.1206 |
| Weighted residual factors for all reflections included in the refinement | 0.122 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.043 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4127015.html
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Users of the data should acknowledge the original authors of the
structural data.