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Information card for entry 4127110
Preview
| Coordinates | 4127110.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | Am Cr2 Cs O8 |
|---|---|
| Calculated formula | Am Cr2 Cs O8 |
| Title of publication | Uncovering the Origin of Divergence in the CsM(CrO4)2 (M = La, Pr, Nd, Sm, Eu; Am) Family through Examination of the Chemical Bonding in a Molecular Cluster and by Band Structure Analysis. |
| Authors of publication | Galley, Shane S.; Arico, Alexandra A.; Lee, Tsung-Han; Deng, Xiaoyu; Yao, Yong-Xin; Sperling, Joseph M.; Proust, Vanessa; Storbeck, Julia S.; Dobrosavljevic, Vladimir; Neu, Jennifer N.; Siegrist, Theo; Baumbach, Ryan E.; Albrecht-Schmitt, Thomas E; Kaltsoyannis, Nikolas; Lanatà, Nicola |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2018 |
| a | 5.8341 ± 0.0014 Å |
| b | 7.2548 ± 0.0017 Å |
| c | 9.786 ± 0.002 Å |
| α | 73.026 ± 0.004° |
| β | 88.581 ± 0.005° |
| γ | 81.081 ± 0.005° |
| Cell volume | 391.27 ± 0.15 Å3 |
| Cell temperature | 131 ± 2 K |
| Ambient diffraction temperature | 131 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0278 |
| Residual factor for significantly intense reflections | 0.0218 |
| Weighted residual factors for significantly intense reflections | 0.0456 |
| Weighted residual factors for all reflections included in the refinement | 0.0471 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.074 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4127110.html
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