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Information card for entry 4127261
Preview
Coordinates | 4127261.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C152 H224 F72 N52 O28 P12 Pd8 S4 |
---|---|
Calculated formula | C152 H224 F72 N52 O28 P12 Pd8 S4 |
SMILES | [P](F)(F)(F)(F)(F)[F-].[P](F)(F)(F)(F)(F)[F-].[n]12ccn(c2)c2cc3n4cc[n](c4)[Pd]4([n]5ccn(c6cc7cc(c6)c6cc8n9cc[n](c9)[Pd]9([n]%10ccn(c%11cc%12cc(c%11)c%11cc(n%13cc[n](c%13)[Pd]%13([n]%14ccn(c%15cc(cc(c%15)c%15cc(n%16cc[n](c%16)[Pd]%16([n]%17ccn(c%18cc(cc(c%18)c(c3)c2)n2c[n](cc2)[Pd]2([n]3ccn(c3)c(c8)c6)[N](C)(C)CC[N]2(C)C)c%17)[N](CC[N]%16(C)C)(C)C)cc(n2c[n](cc2)[Pd]2([n]3cn%12cc3)[N](C)(C)CC[N]2(C)C)c%15)n2c[n]([Pd]31[N](C)(C)CC[N]3(C)C)cc2)c%14)[N](CC[N]%13(C)C)(C)C)cc(n1c[n](cc1)[Pd]1([n]2cn7cc2)[N](C)(C)CC[N]1(C)C)c%11)c%10)[N](CC[N]9(C)C)(C)C)c5)[N](CC[N]4(C)C)(C)C.O.O.O.[P](F)(F)(F)(F)(F)[F-].S(=O)(C)C.N(=O)(=O)[O-].[P](F)(F)(F)(F)(F)[F-].[P](F)(F)(F)(F)(F)[F-].[P](F)(F)(F)(F)(F)[F-].[P](F)(F)(F)(F)(F)[F-].[P](F)(F)(F)(F)(F)[F-].[P](F)(F)(F)(F)(F)[F-].O.O.O.O.O.O.O.O.O.[P](F)(F)(F)(F)(F)[F-].[P](F)(F)(F)(F)(F)[F-].[P](F)(F)(F)(F)(F)[F-].CS(C)=O.CS(C)=O.CS(C)=O.N(=O)(=O)[O-].N(=O)(=O)[O-].N(=O)(=O)[O-] |
Title of publication | Unusual Behaviour of Donor-Acceptor Stenhouse Adducts (DASA) in Confined Space of a Water Soluble PdII8 Molecular Vessel. |
Authors of publication | Saha, Rupak; Devaraj, Anthonisamy; Bhattacharyya, Soumalya; Das, Soumik; Zangrando, Ennio; Mukherjee, Partha Sarathi |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2019 |
a | 33.412 ± 0.005 Å |
b | 33.412 ± 0.005 Å |
c | 14.63 ± 0.003 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 16332 ± 5 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 8 |
Space group number | 86 |
Hermann-Mauguin space group symbol | P 42/n :2 |
Hall space group symbol | -P 4bc |
Residual factor for all reflections | 0.1122 |
Residual factor for significantly intense reflections | 0.0751 |
Weighted residual factors for significantly intense reflections | 0.2217 |
Weighted residual factors for all reflections included in the refinement | 0.2452 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.941 |
Diffraction radiation wavelength | 0.7 Å |
Diffraction radiation type | synchrotron |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4127261.html
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