Information card for entry 4127271

Structure parameters

• Formula: C216 H180 Ag32 Cd12 Se36
• Calculated formula: C216 H180 Ag32 Cd12 Se36
• SMILES: [Cd]123[Se]([Ag]4[Se]([Cd]56[Se]([Ag]789[Ag]%10%11%12%13%14%15%16[Ag]%17%18%19%20%21%22%23[Ag]%24%25%26%27%28%29%10[Ag]%10%30%31%32%33%11%17[Ag]%11%17[Ag]%34%35%26[Ag]%26%36%24[Ag]%24%21[Ag]%21%25[Ag]%25%37%18[Ag]%18%38%20[Ag]%20%13[Ag]8%23[Se]6([Cd]6([Se]4c4ccccc4)[Se]3([Ag]%30([Ag]3%19[Ag]4%10([Ag]8%31([Ag]%14([Ag]%10%33[Ag]%139%16[Ag]97%12[Ag]%27([Ag]7%15[Ag]%29%34%26[Se]([Cd]%12%14[Se]([Ag]%15[Se]([Cd]%16([Se]%12([Ag]%28%11[Ag]%3248[Se]%16c4ccccc4)c4ccccc4)[Se]%10([Cd]([Se]%15c4ccccc4)([Se]%13c4ccccc4)[Se]7%14c4ccccc4)c4ccccc4)c4ccccc4)c4ccccc4)c4ccccc4)[Se]4([Cd]7([Se]([Ag]8[Se]([Cd]4([Se]9c4ccccc4)[Se]%20([Cd]([Se]8c4ccccc4)([Se]%38c4ccccc4)[Se]%247c4ccccc4)c4ccccc4)c4ccccc4)c4ccccc4)[Se]%36c4ccccc4)c4ccccc4)[Se]15c1ccccc1)[Se]2c1ccccc1)[Se]([Cd]12[Se]([Ag]4[Se]([Cd]([Se]%172c2ccccc2)([Se]%35c2ccccc2)[Se]%21([Cd]([Se]4c2ccccc2)([Se]%37c2ccccc2)[Se]31c1ccccc1)c1ccccc1)c1ccccc1)c1ccccc1)c1ccccc1)[Ag]%22%25%18[Se]6c1ccccc1)c1ccccc1)c1ccccc1)c1ccccc1)c1ccccc1)c1ccccc1
• Title of publication: Cd₁₂Ag₃₂(SePh)₃₆: Non-Noble Metal Doped Silver Nanoclusters.
• Authors of publication: Bootharaju, Megalamane S.; Chang, Hogeun; Deng, Guocheng; Malola, Sami; Baek, Woonhyuk; Häkkinen, Hannu; Zheng, Nanfeng; Hyeon, Taeghwan
• Journal of publication: Journal of the American Chemical Society
• Year of publication: 2019
• Journal volume: 141
• Journal issue: 21
• Pages of publication: 8422 - 8425
• a: 19.2821 ± 0.0004 Å
• b: 19.3677 ± 0.0004 Å
• c: 34.7903 ± 0.0005 Å
• α: 88.3916 ± 0.0013°
• β: 86.2435 ± 0.0013°
• γ: 85.6543 ± 0.0015°
• Cell volume: 12923.8 ± 0.4 ų
• Cell temperature: 100.01 ± 0.1 K
• Ambient diffraction temperature: 100.01 ± 0.1 K
• Number of distinct elements: 5
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0741
• Residual factor for significantly intense reflections: 0.063
• Weighted residual factors for significantly intense reflections: 0.1565
• Weighted residual factors for all reflections included in the refinement: 0.1666
• Goodness-of-fit parameter for all reflections included in the refinement: 1.075
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 1.54184 Å
• Diffraction radiation type: CuKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No