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Information card for entry 4127840
Preview
| Coordinates | 4127840.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C25 H18 B D6 F N8 Ni |
|---|---|
| Calculated formula | C25 H18 B D6 F N8 Ni |
| SMILES | [BH]12n3ccc[n]3[Ni]3(c4ccccc4c4c3cccc4)(F)([n]3cccn13)[n]1cccn21.N#CC([2H])([2H])[2H].N#CC([2H])([2H])[2H] |
| Title of publication | Aryl-Fluoride Bond-Forming Reductive Elimination from Nickel(IV) Centers. |
| Authors of publication | Meucci, Elizabeth A.; Ariafard, Alireza; Canty, Allan J.; Kampf, Jeff W.; Sanford, Melanie S. |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2019 |
| Journal volume | 141 |
| Journal issue | 33 |
| Pages of publication | 13261 - 13267 |
| a | 14.4891 ± 0.0001 Å |
| b | 18.8696 ± 0.0002 Å |
| c | 8.5264 ± 0.0001 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 2331.15 ± 0.04 Å3 |
| Cell temperature | 85 ± 2 K |
| Ambient diffraction temperature | 85 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 62 |
| Hermann-Mauguin space group symbol | P n m a |
| Hall space group symbol | -P 2ac 2n |
| Residual factor for all reflections | 0.0304 |
| Residual factor for significantly intense reflections | 0.0303 |
| Weighted residual factors for significantly intense reflections | 0.0761 |
| Weighted residual factors for all reflections included in the refinement | 0.0762 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.104 |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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