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Information card for entry 4127942
Preview
| Coordinates | 4127942.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C71 H70 F24 N9 O6 P4 |
|---|---|
| Calculated formula | C71 H70 F24 N9 O6 P4 |
| Title of publication | Stabilizing the Naphthalenediimide Radical within a Tetracationic Cyclophane. |
| Authors of publication | Jiao, Tianyu; Cai, Kang; Nelson, Jordan N.; Jiao, Yang; Qiu, Yunyan; Wu, Guangcheng; Zhou, Jiawang; Cheng, Chuyang; Shen, Dengke; Feng, Yuanning; Liu, Zhichang; Wasielewski, Michael R.; Stoddart, J. Fraser; Li, Hao |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2019 |
| Journal volume | 141 |
| Journal issue | 42 |
| Pages of publication | 16915 - 16922 |
| a | 11.3842 ± 0.0006 Å |
| b | 18.1455 ± 0.001 Å |
| c | 20.4946 ± 0.0011 Å |
| α | 112.76 ± 0.005° |
| β | 91.764 ± 0.004° |
| γ | 102.586 ± 0.005° |
| Cell volume | 3778.9 ± 0.4 Å3 |
| Cell temperature | 181.8 K |
| Ambient diffraction temperature | 181.8 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1701 |
| Residual factor for significantly intense reflections | 0.1216 |
| Weighted residual factors for significantly intense reflections | 0.3338 |
| Weighted residual factors for all reflections included in the refinement | 0.3884 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.284 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4127942.html
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Users of the data should acknowledge the original authors of the
structural data.