Information card for entry 4128116
| Formula |
C66 H66 N4 O2 S2 |
| Calculated formula |
C66 H66 N4 O2 S2 |
| Title of publication |
High Exciton Diffusion Coefficients in Fused Ring Electron Acceptor Films. |
| Authors of publication |
Chandrabose, Sreelakshmi; Chen, Kai; Barker, Alex J.; Sutton, Joshua J.; Prasad, Shyamal K. K.; Zhu, Jingshuai; Zhou, Jiadong; Gordon, Keith C.; Xie, Zengqi; Zhan, Xiaowei; Hodgkiss, Justin M. |
| Journal of publication |
Journal of the American Chemical Society |
| Year of publication |
2019 |
| Journal volume |
141 |
| Journal issue |
17 |
| Pages of publication |
6922 - 6929 |
| a |
11.7944 ± 0.0002 Å |
| b |
17.3479 ± 0.0003 Å |
| c |
25.4626 ± 0.0003 Å |
| α |
107.716 ± 0.001° |
| β |
94.056 ± 0.001° |
| γ |
107.82 ± 0.001° |
| Cell volume |
4646.92 ± 0.13 Å3 |
| Cell temperature |
99.9 ± 0.3 K |
| Ambient diffraction temperature |
99.9 ± 0.3 K |
| Number of distinct elements |
5 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0532 |
| Residual factor for significantly intense reflections |
0.047 |
| Weighted residual factors for significantly intense reflections |
0.1289 |
| Weighted residual factors for all reflections included in the refinement |
0.1333 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.046 |
| Diffraction radiation probe |
x-ray |
| Diffraction radiation wavelength |
1.54184 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/4128116.html
