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Information card for entry 4129215
Preview
Coordinates | 4129215.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C16 H18 F12 N2 O4 Zn |
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Calculated formula | C16 H18 F12 N2 O4 Zn |
SMILES | [Zn]123(OC(=CC(=[O]1)C(F)(F)F)C(F)(F)F)(OC(=CC(=[O]2)C(F)(F)F)C(F)(F)F)[N](CC[N]3(C)C)(C)C |
Title of publication | MOCVD-derived highly transparent, conductive zinc- and tin-doped indium oxide thin films: precursor synthesis, metastable phase film growth and characterization, and application as anodes in polymer light-emitting diodes. |
Authors of publication | Ni, Jun; Yan, He; Wang, Anchuang; Yang, Yu; Stern, Charlotte L.; Metz, Andrew W.; Jin, Shu; Wang, Lian; Marks, Tobin J.; Ireland, John R.; Kannewurf, Carl R. |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2005 |
Journal volume | 127 |
Journal issue | 15 |
Pages of publication | 5613 - 5624 |
a | 13.2588 ± 0.0008 Å |
b | 10.3996 ± 0.0006 Å |
c | 17.3331 ± 0.001 Å |
α | 90° |
β | 108.54 ± 0.001° |
γ | 90° |
Cell volume | 2266 ± 0.2 Å3 |
Cell temperature | 153 ± 2 K |
Ambient diffraction temperature | 153 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0335 |
Residual factor for significantly intense reflections | 0.0277 |
Weighted residual factors for significantly intense reflections | 0.0723 |
Weighted residual factors for all reflections included in the refinement | 0.0764 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.037 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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