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Information card for entry 4129346
Preview
| Coordinates | 4129346.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C32 H76 Li2 N2 O6 Si4 |
|---|---|
| Calculated formula | C32 H76 Li2 N2 O6 Si4 |
| SMILES | C(C)(C)(C)[Si@]1(N2CCC[C@H]2C[O](C)[Li]2([CH2]([Si](C)(C)C)[Li]3([CH2]2[Si](C)(C)C)[O](C)[Si@@](C(C)(C)C)(N2CCC[C@H]2C[O]3C)OC)[O]1C)OC |
| Title of publication | Stereocontrol in nucleophilic substitution reactions at silicon: the role of permutation in generating silicon-centered chirality. |
| Authors of publication | Bauer, Jonathan O.; Strohmann, Carsten |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2015 |
| Journal volume | 137 |
| Journal issue | 13 |
| Pages of publication | 4304 - 4307 |
| a | 9.3843 ± 0.0002 Å |
| b | 9.3843 ± 0.0002 Å |
| c | 51.04 ± 0.002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 4494.8 ± 0.2 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 92 |
| Hermann-Mauguin space group symbol | P 41 21 2 |
| Hall space group symbol | P 4abw 2nw |
| Residual factor for all reflections | 0.0493 |
| Residual factor for significantly intense reflections | 0.0443 |
| Weighted residual factors for significantly intense reflections | 0.1041 |
| Weighted residual factors for all reflections included in the refinement | 0.1067 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4129346.html
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