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Information card for entry 4129956
Preview
Coordinates | 4129956.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C60 H102 Fe3 K N8 O6 Si3 |
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Calculated formula | C60 H102 Fe3 K N8 O6 Si3 |
SMILES | C12CC3CC(C1)[N]14c5ccccc5N([Si](C)(C)C(C)(C)C)[Fe]564[N]42c2ccccc2N([Si](C)(C)C(C)(C)C)[Fe]254[N]43c3ccccc3N([Si](C)(C)C(C)(C)C)[Fe]1624.C1C[O]2CC[O]3CC[N]45CC[O]6CC[O]7CC[N]81CC[O]1CC[O](CC4)[K]2356781 |
Title of publication | Maximizing Electron Exchange in a [Fe3] Cluster. |
Authors of publication | Hernández Sánchez, Raúl; Bartholomew, Amymarie K.; Powers, Tamara M.; Ménard, Gabriel; Betley, Theodore A. |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2016 |
Journal volume | 138 |
Journal issue | 7 |
Pages of publication | 2235 - 2243 |
a | 13.449 ± 0.003 Å |
b | 19.29 ± 0.005 Å |
c | 25.532 ± 0.006 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 6624 ± 3 Å3 |
Cell temperature | 100 ± 1 K |
Ambient diffraction temperature | 100 ± 1 K |
Number of distinct elements | 7 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.0645 |
Residual factor for significantly intense reflections | 0.047 |
Weighted residual factors for significantly intense reflections | 0.1013 |
Weighted residual factors for all reflections included in the refinement | 0.1088 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.02 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4129956.html
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Users of the data should acknowledge the original authors of the
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