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Information card for entry 4130082
Preview
| Coordinates | 4130082.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C34 H36 N4 Ni |
|---|---|
| Calculated formula | C34 H36 N4 Ni |
| SMILES | [Ni]12(n3c(c(cc3C)C)c3[n]1cccc3)([n]1c3c(ccc1)ccc1c3[n]2ccc1)c1ccccc1.CCCCC |
| Title of publication | Bimetallic C-C Bond-Forming Reductive Elimination from Nickel. |
| Authors of publication | Xu, Hongwei; Diccianni, Justin B.; Katigbak, Joseph; Hu, Chunhua; Zhang, Yingkai; Diao, Tianning |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2016 |
| Journal volume | 138 |
| Journal issue | 14 |
| Pages of publication | 4779 - 4786 |
| a | 12.3392 ± 0.0014 Å |
| b | 15.9041 ± 0.0018 Å |
| c | 14.8784 ± 0.0017 Å |
| α | 90° |
| β | 103.314 ± 0.0016° |
| γ | 90° |
| Cell volume | 2841.3 ± 0.6 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0604 |
| Residual factor for significantly intense reflections | 0.0503 |
| Weighted residual factors for significantly intense reflections | 0.1438 |
| Weighted residual factors for all reflections included in the refinement | 0.1521 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.044 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4130082.html
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