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Information card for entry 4130215
Preview
Coordinates | 4130215.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C53 H61 Al P2 Pt S2 |
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Calculated formula | C53 H61 Al P2 Pt S2 |
SMILES | [Pt]1([P](c2ccccc2)(c2ccccc2)c2ccccc2)[P](/C(=C/c2ccccc2)[Al](SC1=S)(C(C)(C)C)C(C)(C)C)(c1c(C)cc(C)cc1C)c1c(cc(cc1C)C)C |
Title of publication | A Significant but Constrained Geometry Pt→Al Interaction: Fixation of CO2 and CS2, Activation of H2 and PhCONH2. |
Authors of publication | Devillard, Marc; Declercq, Richard; Nicolas, Emmanuel; Ehlers, Andreas W.; Backs, Jana; Saffon-Merceron, Nathalie; Bouhadir, Ghenwa; Slootweg, J. Chris; Uhl, Werner; Bourissou, Didier |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2016 |
Journal volume | 138 |
Journal issue | 14 |
Pages of publication | 4917 - 4926 |
a | 20.0944 ± 0.0015 Å |
b | 14.1515 ± 0.001 Å |
c | 17.3483 ± 0.0012 Å |
α | 90° |
β | 100.857 ± 0.002° |
γ | 90° |
Cell volume | 4845 ± 0.6 Å3 |
Cell temperature | 193 ± 2 K |
Ambient diffraction temperature | 193 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0479 |
Residual factor for significantly intense reflections | 0.0387 |
Weighted residual factors for significantly intense reflections | 0.09 |
Weighted residual factors for all reflections included in the refinement | 0.0949 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.061 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4130215.html
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Users of the data should acknowledge the original authors of the
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