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Information card for entry 4130398
Preview
Coordinates | 4130398.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C35 H10 Cl14 N S4 |
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Calculated formula | C35 H10 Cl14 N S4 |
SMILES | Clc1c(/C=C/c2ccc(n3cc4SC(Sc4c3)=C3SC=CS3)cc2)c(Cl)c(Cl)c(c1Cl)[C](c1c(Cl)c(Cl)c(Cl)c(Cl)c1Cl)c1c(Cl)c(Cl)c(Cl)c(Cl)c1Cl |
Title of publication | Pressure-Induced Conductivity in a Neutral Nonplanar Spin-Localized Radical. |
Authors of publication | Souto, Manuel; Cui, HengBo; Peña-Álvarez, Miriam; Baonza, Valentín G; Jeschke, Harald O.; Tomic, Milan; Valentí, Roser; Blasi, Davide; Ratera, Imma; Rovira, Concepció; Veciana, Jaume |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2016 |
Journal volume | 138 |
Journal issue | 36 |
Pages of publication | 11517 - 11525 |
a | 17.411 ± 0.003 Å |
b | 7.9517 ± 0.0016 Å |
c | 30.177 ± 0.006 Å |
α | 90° |
β | 103.588 ± 0.004° |
γ | 90° |
Cell volume | 4061 ± 1.3 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 5 |
Space group number | 4 |
Hermann-Mauguin space group symbol | P 1 21 1 |
Hall space group symbol | P 2yb |
Residual factor for all reflections | 0.2193 |
Residual factor for significantly intense reflections | 0.0614 |
Weighted residual factors for significantly intense reflections | 0.1036 |
Weighted residual factors for all reflections included in the refinement | 0.1457 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.917 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4130398.html
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