Information card for entry 4130579

Structure parameters

• Formula: C24 H22 N2 Si
• Calculated formula: C24 H22 N2 Si
• SMILES: [SiH](c1cn(c2c1cccc2)C)(c1cn(c2c1cccc2)C)c1ccccc1
• Title of publication: Brønsted Acid-Promoted Formation of Stabilized Silylium Ions for Catalytic Friedel-Crafts C-H Silylation.
• Authors of publication: Chen, Qing-An; Klare, Hendrik F. T.; Oestreich, Martin
• Journal of publication: Journal of the American Chemical Society
• Year of publication: 2016
• Journal volume: 138
• Journal issue: 25
• Pages of publication: 7868 - 7871
• a: 9.0894 ± 0.0003 Å
• b: 11.2642 ± 0.0004 Å
• c: 20.8038 ± 0.0007 Å
• α: 95.61 ± 0.003°
• β: 92.724 ± 0.003°
• γ: 107.775 ± 0.003°
• Cell volume: 2011.86 ± 0.12 ų
• Cell temperature: 150 ± 2 K
• Ambient diffraction temperature: 150 ± 0.1 K
• Number of distinct elements: 4
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0451
• Residual factor for significantly intense reflections: 0.0414
• Weighted residual factors for significantly intense reflections: 0.1056
• Weighted residual factors for all reflections included in the refinement: 0.1089
• Goodness-of-fit parameter for all reflections included in the refinement: 1.02
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 1.54184 Å
• Diffraction radiation type: CuKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No