Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4130862
Preview
Coordinates | 4130862.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C51 H56 N10 O11 Zn |
---|---|
Calculated formula | C51 H56 N10 O11 Zn |
SMILES | [Zn]1234([n]5ccc(OC)cc5N=C5N1C(=Nc1[n]2ccc(OC)c1)c1c5ccc(OCCOCCOC)c1)[n]1ccc(OC)cc1N=C1N3C(=Nc2[n]4ccc(OC)c2)c2c1cc(OCCOCCOC)cc2.OC |
Title of publication | Mechanism-Based Development of a Low-Potential, Soluble, and Cyclable Multielectron Anolyte for Nonaqueous Redox Flow Batteries. |
Authors of publication | Sevov, Christo S.; Fisher, Sydney L.; Thompson, Levi T.; Sanford, Melanie S. |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2016 |
Journal volume | 138 |
Journal issue | 47 |
Pages of publication | 15378 - 15384 |
a | 11.1579 ± 0.0008 Å |
b | 41.517 ± 0.003 Å |
c | 12.1931 ± 0.0006 Å |
α | 90° |
β | 104.766 ± 0.006° |
γ | 90° |
Cell volume | 5461.8 ± 0.6 Å3 |
Cell temperature | 85 ± 2 K |
Ambient diffraction temperature | 85 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.1388 |
Residual factor for significantly intense reflections | 0.1167 |
Weighted residual factors for significantly intense reflections | 0.3261 |
Weighted residual factors for all reflections included in the refinement | 0.3606 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.582 |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4130862.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.