Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4131213
Preview
Coordinates | 4131213.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C54 H114 Si14 |
---|---|
Calculated formula | C54 H114 Si14 |
SMILES | C1(CCC([Si]1=[Si](c1c(cc(cc1C)C)C)[Si](C)(C)[Si](C)(C)[Si](c1c(cc(cc1C)C)C)=[Si]1C(CCC1([Si](C)(C)C)[Si](C)(C)C)([Si](C)(C)C)[Si](C)(C)C)([Si](C)(C)C)[Si](C)(C)C)([Si](C)(C)C)[Si](C)(C)C |
Title of publication | Pentasila-1,4-diene: Homoconjugation between Si═Si Double Bonds via a SiMe(2) Unit. |
Authors of publication | Kosai, Tomoyuki; Ishida, Shintaro; Iwamoto, Takeaki |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2017 |
Journal volume | 139 |
Journal issue | 1 |
Pages of publication | 99 - 102 |
a | 9.7545 ± 0.0017 Å |
b | 24.247 ± 0.004 Å |
c | 16.831 ± 0.003 Å |
α | 90° |
β | 96.034 ± 0.002° |
γ | 90° |
Cell volume | 3958.8 ± 1.2 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 3 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/a 1 |
Hall space group symbol | -P 2yab |
Residual factor for all reflections | 0.0805 |
Residual factor for significantly intense reflections | 0.0672 |
Weighted residual factors for significantly intense reflections | 0.1797 |
Weighted residual factors for all reflections included in the refinement | 0.1867 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.064 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4131213.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.