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Information card for entry 4131396
Preview
Coordinates | 4131396.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C24 H34 B F3 N7 O3 P W |
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Calculated formula | C24 H34 B F3 N7 O3 P W |
SMILES | [W]123([P](C)(C)C)([n]4n(ccc4)[BH](n4[n]1ccc4)n1[n]2ccc1)(N=O)[CH]1C=C(CC([CH]3=1)C(F)(F)F)C(C(=O)OC)(C)C |
Title of publication | Sequential Tandem Addition to a Tungsten-Trifluorotoluene Complex: A Versatile Method for the Preparation of Highly Functionalized Trifluoromethylated Cyclohexenes. |
Authors of publication | Wilson, Katy B.; Myers, Jeffery T.; Nedzbala, Hannah S.; Combee, Logan A.; Sabat, Michal; Harman, W. Dean |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2017 |
Journal volume | 139 |
Journal issue | 33 |
Pages of publication | 11401 - 11412 |
a | 13.566 ± 0.002 Å |
b | 13.861 ± 0.002 Å |
c | 15.236 ± 0.003 Å |
α | 90° |
β | 96.108 ± 0.003° |
γ | 90° |
Cell volume | 2848.7 ± 0.8 Å3 |
Cell temperature | 153 ± 2 K |
Ambient diffraction temperature | 153 ± 2 K |
Number of distinct elements | 8 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0887 |
Residual factor for significantly intense reflections | 0.0688 |
Weighted residual factors for significantly intense reflections | 0.1661 |
Weighted residual factors for all reflections included in the refinement | 0.1767 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.33 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4131396.html
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