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Information card for entry 4131638
Preview
Coordinates | 4131638.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C32 H72 Sb2 Si8 |
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Calculated formula | C32 H72 Sb2 Si8 |
SMILES | C12(C(C(=C1[Si](C)(C)C)[Si](C)(C)C)([Sb]2[Sb]1C2(C1(C(=C2[Si](C)(C)C)[Si](C)(C)C)[Si](C)(C)C)[Si](C)(C)C)[Si](C)(C)C)[Si](C)(C)C |
Title of publication | Bis(stibahousene). |
Authors of publication | Lee, Vladimir Ya; Ota, Kei; Ito, Yuki; Gapurenko, Olga A.; Sekiguchi, Akira; Minyaev, Ruslan M.; Minkin, Vladimir I.; Gornitzka, Heinz |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2017 |
Journal volume | 139 |
Journal issue | 39 |
Pages of publication | 13897 - 13902 |
a | 27.518 ± 0.004 Å |
b | 9.3225 ± 0.0013 Å |
c | 19.913 ± 0.003 Å |
α | 90° |
β | 109.766 ± 0.001° |
γ | 90° |
Cell volume | 4807.4 ± 1.2 Å3 |
Cell temperature | 150 K |
Ambient diffraction temperature | 150 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0418 |
Residual factor for significantly intense reflections | 0.0413 |
Weighted residual factors for significantly intense reflections | 0.0943 |
Weighted residual factors for all reflections included in the refinement | 0.0945 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.296 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4131638.html
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