Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4131792
Preview
Coordinates | 4131792.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C80 H70 Cl4 O4 Se3 |
---|---|
Calculated formula | C80 H70 Cl4 O4 Se3 |
SMILES | [se]1c(c2c3c(c4c(c2c1C)cc1c(cccc1)c4)cc1c2c(c(OC)c(OC)c1c3)cc1c(c3c(cc4c(c5c(cc6c(c7c(cc8c(c7)cccc8)c7c([se]c(c67)CCC)C)c5)c(OC)c4OC)c3)c3c1c([se]c3CCC)CCC)c2)CCC.ClCCl.ClCCl |
Title of publication | Expanded Helicenes: A General Synthetic Strategy and Remarkable Supramolecular and Solid-State Behavior. |
Authors of publication | Kiel, Gavin R.; Patel, Sajan C.; Smith, Patrick W.; Levine, Daniel S.; Tilley, T. Don |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2017 |
Journal volume | 139 |
Journal issue | 51 |
Pages of publication | 18456 - 18459 |
a | 12.9527 ± 0.0007 Å |
b | 16.0679 ± 0.0008 Å |
c | 16.7417 ± 0.0009 Å |
α | 70.269 ± 0.003° |
β | 77.377 ± 0.003° |
γ | 86.182 ± 0.003° |
Cell volume | 3200.4 ± 0.3 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1165 |
Residual factor for significantly intense reflections | 0.0832 |
Weighted residual factors for significantly intense reflections | 0.2348 |
Weighted residual factors for all reflections included in the refinement | 0.2566 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.046 |
Diffraction radiation wavelength | 0.7749 Å |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4131792.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.