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Information card for entry 4132149
Preview
| Coordinates | 4132149.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C82 H36 Cu2 F30 N8 O2 |
|---|---|
| Calculated formula | C82 H36 Cu2 F30 N8 O2 |
| Title of publication | Ground-State Copper(III) Stabilized by N-Confused/N-Linked Corroles: Synthesis, Characterization, and Redox Reactivity. |
| Authors of publication | Maurya, Yogesh Kumar; Noda, Katsuya; Yamasumi, Kazuhisa; Mori, Shigeki; Uchiyama, Tomoki; Kamitani, Kazutaka; Hirai, Tomoyasu; Ninomiya, Kakeru; Nishibori, Maiko; Hori, Yuta; Shiota, Yoshihito; Yoshizawa, Kazunari; Ishida, Masatoshi; Furuta, Hiroyuki |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2018 |
| Journal volume | 140 |
| Journal issue | 22 |
| Pages of publication | 6883 - 6892 |
| a | 15.3803 ± 0.0004 Å |
| b | 16.8229 ± 0.0005 Å |
| c | 16.9418 ± 0.0005 Å |
| α | 66.502 ± 0.003° |
| β | 77.999 ± 0.003° |
| γ | 76.171 ± 0.003° |
| Cell volume | 3872.2 ± 0.2 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1212 |
| Residual factor for significantly intense reflections | 0.0863 |
| Weighted residual factors for significantly intense reflections | 0.2182 |
| Weighted residual factors for all reflections included in the refinement | 0.2427 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.013 |
| Diffraction radiation wavelength | 0.71075 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4132149.html
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Users of the data should acknowledge the original authors of the
structural data.