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Information card for entry 4132314
Preview
Coordinates | 4132314.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | PG-164 |
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Formula | C30 H56 B Mo N6 Na O7 P |
Calculated formula | C30 H56 B Mo N6 Na O7 P |
SMILES | [P]([Mo]123(C#[O][Na]45([O]#C1)([O](C)CC[O]5C)[O](CC[O]4C)C)[n]1c(C)cc(C)n1[BH](n1[n]2c(C)cc1C)n1[n]3c(C)cc1C)(C)(C)C.O(CCOC)C |
Title of publication | Linearly Two-Coordinated Silicon: Transition Metal Complexes with the Functional Groups M≡Si-M and M═Si═M. |
Authors of publication | Ghana, Priyabrata; Arz, Marius I.; Chakraborty, Uttam; Schnakenburg, Gregor; Filippou, Alexander C. |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2018 |
Journal volume | 140 |
Journal issue | 23 |
Pages of publication | 7187 - 7198 |
a | 17.2762 ± 0.0007 Å |
b | 14.4377 ± 0.0004 Å |
c | 16.8995 ± 0.0007 Å |
α | 90° |
β | 114.912 ± 0.003° |
γ | 90° |
Cell volume | 3823 ± 0.3 Å3 |
Cell temperature | 123 K |
Ambient diffraction temperature | 123 K |
Number of distinct elements | 8 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0912 |
Residual factor for significantly intense reflections | 0.0585 |
Weighted residual factors for significantly intense reflections | 0.1322 |
Weighted residual factors for all reflections included in the refinement | 0.1452 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.026 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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The link is: https://www.crystallography.net/4132314.html
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